CVE-2025-59297

| EUVD-2025-32570 HIGH
2025-10-03 759f5e80-c8e1-4224-bead-956d7b33c98b
7.8
CVSS 3.1
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CVSS Vector

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H
Attack Vector
Local
Attack Complexity
Low
Privileges Required
None
User Interaction
Required
Scope
Unchanged
Confidentiality
High
Integrity
High
Availability
High

Lifecycle Timeline

3
EUVD ID Assigned
Mar 13, 2026 - 19:29 euvd
EUVD-2025-32570
Analysis Generated
Mar 13, 2026 - 19:29 vuln.today
CVE Published
Oct 03, 2025 - 03:15 nvd
HIGH 7.8

Tags

Buffer Overflow Memory Corruption Diascreen

Description

Delta Electronics DIAScreen lacks proper validation of the user-supplied file. If a user opens a malicious file, an attacker can leverage this vulnerability to execute code in the context of the current process.

Analysis

Delta Electronics DIAScreen lacks proper validation of the user-supplied file. If a user opens a malicious file, an attacker can leverage this vulnerability to execute code in the context of the current process.

Technical Context

An out-of-bounds memory access occurs when code reads from or writes to memory locations outside the intended buffer boundaries. This vulnerability is classified as Out-of-bounds Write (CWE-787).

Affected Products

Affected products: Deltaww Diascreen

Remediation

Implement proper bounds checking on all array and buffer accesses. Use memory-safe languages or static analysis tools to detect OOB issues.

Priority Score

39
Low Medium High Critical
KEV: 0
EPSS: +0.0
CVSS: +39
POC: 0

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CVE-2025-59297 vulnerability details – vuln.today
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