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Wcn3620 Firmware CVE-2024-53017

| EUVDEUVD-2024-54636 MEDIUM
Use of Out-of-range Pointer Offset (CWE-823)
2025-06-03 product-security@qualcomm.com
Buffer Overflow Memory Corruption Wcn3620 Firmware Wcn3660b Firmware Snapdragon 429 Mobile Platform Firmware Sdm429w Firmware
6.6
CVSS 3.1 · NVD
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Severity by source

NVD PRIMARY
6.6 MEDIUM
AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Primary rating from NVD · only source for this CVE.

CVSS VectorNVD

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Attack Vector
Local
Attack Complexity
Low
Privileges Required
Low
User Interaction
None
Scope
Unchanged
Confidentiality
Low
Integrity
High
Availability
Low

Lifecycle Timeline

3
EUVD ID Assigned
Mar 14, 2026 - 17:04 euvd
EUVD-2024-54636
Analysis Generated
Mar 14, 2026 - 17:04 vuln.today
CVE Published
Jun 03, 2025 - 06:15 nvd
MEDIUM 6.6

DescriptionCVE.org

Memory corruption while handling test pattern generator IOCTL command.

Analysis

Memory corruption while handling test pattern generator IOCTL command.

Technical ContextAI

This vulnerability is classified as Use of Out-of-range Pointer Offset (CWE-823).

RemediationAI

Monitor vendor advisories for patches. Apply mitigations such as network segmentation, access restrictions, and monitoring.

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CVE-2024-53017 vulnerability details – vuln.today
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