EUVD-2024-54636
2025-06-03
[email protected]
6.6
CVSS 3.1
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CVSS Vector
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Attack Vector
Local
Attack Complexity
Low
Privileges Required
Low
User Interaction
None
Scope
Unchanged
Confidentiality
Low
Integrity
High
Availability
Low
Lifecycle Timeline
3
Analysis Generated
Mar 14, 2026 - 17:04 vuln.today
EUVD ID Assigned
Mar 14, 2026 - 17:04 euvd
EUVD-2024-54636
CVE Published
Jun 03, 2025 - 06:15 nvd
MEDIUM 6.6
Tags
Description
Memory corruption while handling test pattern generator IOCTL command.
Analysis
Memory corruption while handling test pattern generator IOCTL command.
Technical Context
This vulnerability is classified as Use of Out-of-range Pointer Offset (CWE-823).
Affected Products
Affected products: Qualcomm Sdm429W Firmware -, Qualcomm Snapdragon 429 Mobile Platform Firmware -, Qualcomm Wcn3620 Firmware -, Qualcomm Wcn3660B Firmware -
Remediation
Monitor vendor advisories for patches. Apply mitigations such as network segmentation, access restrictions, and monitoring.
Priority Score
33
Low
Medium
High
Critical
KEV: 0
EPSS: +0.0
CVSS: +33
POC: 0
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External POC / Exploit Code
Leaving vuln.today
Destination URL
POC code from unknown sources may be malicious, contain backdoors, or be fake.
Always review and test exploit code in a safe, isolated environment (VM/sandbox).
Verify the source reputation and cross-reference with known databases (Exploit-DB, GitHub Security).