EUVD-2025-20469

| CVE-2025-27047 HIGH
2025-07-08 [email protected]
7.8
CVSS 3.1
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CVSS Vector

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Attack Vector
Local
Attack Complexity
Low
Privileges Required
Low
User Interaction
None
Scope
Unchanged
Confidentiality
High
Integrity
High
Availability
High

Lifecycle Timeline

3
Analysis Generated
Mar 16, 2026 - 04:21 vuln.today
EUVD ID Assigned
Mar 16, 2026 - 04:21 euvd
EUVD-2025-20469
CVE Published
Jul 08, 2025 - 13:15 nvd
HIGH 7.8

Description

Memory corruption while processing the TESTPATTERNCONFIG escape path.

Analysis

Memory corruption while processing the TESTPATTERNCONFIG escape path.

Technical Context

A use-after-free vulnerability occurs when a program continues to use a pointer after the referenced memory has been freed, leading to undefined behavior. This vulnerability is classified as Use After Free (CWE-416).

Affected Products

Affected products: Qualcomm Fastconnect 6700 Firmware -, Qualcomm Fastconnect 6900 Firmware -, Qualcomm Fastconnect 7800 Firmware -, Qualcomm Qcm5430 Firmware -, Qualcomm Qcm6490 Firmware -

Remediation

Use memory-safe languages. Implement proper object lifecycle management. Use static and dynamic analysis tools to detect UAF patterns.

Priority Score

39
Low Medium High Critical
KEV: 0
EPSS: +0.0
CVSS: +39
POC: 0

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EUVD-2025-20469 vulnerability details – vuln.today

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