CVE-2024-45573

HIGH
2025-02-03 [email protected]
7.8
CVSS 3.1
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CVSS Vector

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Attack Vector
Local
Attack Complexity
Low
Privileges Required
Low
User Interaction
None
Scope
Unchanged
Confidentiality
High
Integrity
High
Availability
High

Lifecycle Timeline

2
Analysis Generated
Mar 28, 2026 - 18:07 vuln.today
CVE Published
Feb 03, 2025 - 17:15 nvd
HIGH 7.8

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Analysis

Memory corruption may occour while generating test pattern due to negative indexing of display ID. Rated high severity (CVSS 7.8), this vulnerability is low attack complexity. No vendor patch available.

Technical Context

This vulnerability is classified under CWE-823. Memory corruption may occour while generating test pattern due to negative indexing of display ID. Affected products include: Qualcomm Fastconnect 6700 Firmware, Qualcomm Fastconnect 6900 Firmware, Qualcomm Fastconnect 7800 Firmware, Qualcomm Qcm5430 Firmware, Qualcomm Qcm6490 Firmware.

Affected Products

Qualcomm Fastconnect 6700 Firmware, Qualcomm Fastconnect 6900 Firmware, Qualcomm Fastconnect 7800 Firmware, Qualcomm Qcm5430 Firmware, Qualcomm Qcm6490 Firmware.

Remediation

No vendor patch is available at time of analysis. Monitor vendor advisories for updates. Apply vendor patches when available. Implement network segmentation and monitoring as interim mitigations.

Priority Score

39
Low Medium High Critical
KEV: 0
EPSS: +0.1
CVSS: +39
POC: 0

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CVE-2024-45573 vulnerability details – vuln.today

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