CVE-2024-45573
HIGHCVSS Vector
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Lifecycle Timeline
2Tags
Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Analysis
Memory corruption may occour while generating test pattern due to negative indexing of display ID. Rated high severity (CVSS 7.8), this vulnerability is low attack complexity. No vendor patch available.
Technical Context
This vulnerability is classified under CWE-823. Memory corruption may occour while generating test pattern due to negative indexing of display ID. Affected products include: Qualcomm Fastconnect 6700 Firmware, Qualcomm Fastconnect 6900 Firmware, Qualcomm Fastconnect 7800 Firmware, Qualcomm Qcm5430 Firmware, Qualcomm Qcm6490 Firmware.
Affected Products
Qualcomm Fastconnect 6700 Firmware, Qualcomm Fastconnect 6900 Firmware, Qualcomm Fastconnect 7800 Firmware, Qualcomm Qcm5430 Firmware, Qualcomm Qcm6490 Firmware.
Remediation
No vendor patch is available at time of analysis. Monitor vendor advisories for updates. Apply vendor patches when available. Implement network segmentation and monitoring as interim mitigations.
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External POC / Exploit Code
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